%0 Generic
%T Modeling and Mitigation of Static Noise Margin Variation in Subthreshold SRAM Cells
%A Zheng, Nan
%A Mazumder, Pinaki
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 1549-8328
%@ 1558-0806
%D 2017
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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