%0 Generic
%T Statistical Distribution of Through-Silicon via Cu Pumping
%A De Messemaeker, Joke
%A Roussel, Philippe J.
%A Pedreira, Olalla Varela
%A Van der Donck, Tom
%A Van Huylenbroeck, Stefaan
%A Beyne, Eric
%A De Wolf, Ingrid
%A Stucchi, Michele
%A Croes, Kristof
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 1558-2574
%@ 1530-4388
%K Electrical and Electronic Engineering
%K Safety, Risk, Reliability and Quality
%K Electronic, Optical and Magnetic Materials
%D 2017
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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