%0 Generic
%T Reliability Investigation of Photoconductive Continuous-Wave Terahertz Emitters
%A Gobel, Thorsten
%A Schoenherr, Daniel
%A Sydlo, Cezary
%A Feiginov, Michael
%A Meissner, Peter
%A Hartnagel, Hans Ludwig
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 0018-9480
%@ 1557-9670
%D 2011
%C Institute of Electrical and Electronics Engineers (IEEE)
%U https://katalog.slub-dresden.de/en/?cHash=d436d54d7a76fc6fe03d5b8c85ebf4cf&tx_find_find%5Baction%5D=citation&tx_find_find%5Bcontroller%5D=Search&tx_find_find%5Bid%5D=ai-49-aHR0cDovL2R4LmRvaS5vcmcvMTAuMTEwOS90bXR0LjIwMTEuMjE1Mzg2OA&tx_find_find%5Btype%5D=endnote
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