%0 Generic
%T On the Capability of Measuring Actual Strain Values With Electrical Impedance Tomography Using Planar Silkscreen Printed Elastoresistive Sensors
%A Wagner, Jonas
%A Gschobmann, Sandra
%A Schagerl, Martin
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 1530-437X
%@ 1558-1748
%@ 2379-9153
%D 2021
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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