%0 Generic
%T Time Division Multiplexing based Test Access for Stacked ICs
%A Ansari, Muhammad Adil
%A Solnagi, Umair Saeed
%A Kim, Jinuk
%A Bughio, Ahsin Murtaza
%A Park, Sungju
%I The Institute of Electronics Engineers of Korea
%@ 1598-1657
%@ 2233-4866
%K Electrical and Electronic Engineering
%K Electronic, Optical and Magnetic Materials
%D 2019
%C The Institute of Electronics Engineers of Korea
%U http://slubdd.de/katalog?TN_libero_mab2
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