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Jannis, Daen [Author]; Müller-Caspary, Knut [Author]; Béché, Armand [Author]; Verbeeck, Jo [Author]

Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope

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MDPI, 2021

Published in: Applied Sciences 11(19), 9058 - (2021). doi:10.3390/app11199058
Guzzinati, Giulio [Author]; Ghielens, Wannes [Author]; Mahr, Christoph [Author]; Béché, Armand [Author]; Rosenauer, Andreas [Author]; Calders, Toon [Author]; Verbeeck, Jo [Author]

Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping featured

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2019

Published in: Applied physics letters ; Volume 114 (2019), issue 24, article 243501
MacArthur, Katherine E. [Author]; Yankovich, Andrew B. [Author]; Béché, Armand [Author]; Luysberg, Martina [Author]; Brown, Hamish G. [Author]; Findlay, Scott D. [Author]; Heggen, Marc [Author]; Allen, Leslie J. [Author]

Optimizing Experimental Conditions for Accurate Quantitative Energy-Dispersive X-ray Analysis of Interfaces at the Atomic Scale

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Cambridge University Press, 2021

Published in: Microscopy and microanalysis 27(3), 528 (2021). doi:10.1017/S1431927621000246
Kleibert, Armin [Author]; Bălan, Ana [Author]; Yanes, Rocio [Author]; Derlet, Peter M. [Author]; Vaz, Carlos A. F. [Author]; Timm, Martin [Author]; Fraile Rodríguez, Arantxa [Author]; Béché, Armand [Author]; Verbeeck, Jo [Author]; Nowak, Ulrich [Author]

Direct observation of enhanced magnetism in individual size- and shape-selected 3d transition metal nanoparticles

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Konstanz: Bibliothek der Universität Konstanz, 2017
Yu, Chu-Ping; Vega Ibañez, Francisco; Béché, Armand; Verbeeck, Johan

Quantum wavefront shaping with a 48-element programmable phase plate for electrons

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Stichting SciPost, 2023

Published in: SciPost Physics, 15 (2023) 6
Jannis, Daen; Müller-Caspary, Knut; Béché, Armand; Verbeeck, Jo

Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope

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MDPI AG, 2021

Published in: Applied Sciences, 11 (2021) 19, Seite 9058
Becker, Maria; Guzzinati, Giulio; Béché, Armand; Verbeeck, Johan; Batelaan, Herman

Asymmetry and non-dispersivity in the Aharonov-Bohm effect

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Springer Science and Business Media LLC, 2019

Published in: Nature Communications, 10 (2019) 1
Vanrompay, Hans; Béché, Armand; Verbeeck, Johan; Bals, Sara

Experimental Evaluation of Undersampling Schemes for Electron Tomography of Nanoparticles

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Wiley, 2019

Published in: Particle & Particle Systems Characterization, 36 (2019) 7
Juchtmans, Roeland; Béché, Armand; Abakumov, Artem; Batuk, Maria; Verbeeck, Jo

Using electron vortex beams to determine chirality of crystals in transmission electron microscopy

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American Physical Society (APS), 2015

Published in: Physical Review B, 91 (2015) 9
Béché, Armand; Van Boxem, Ruben; Van Tendeloo, Gustaaf; Verbeeck, Jo

Magnetic monopole field exposed by electrons

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Springer Science and Business Media LLC, 2014

Published in: Nature Physics, 10 (2014) 1, Seite 26-29
Guzzinati, Giulio; Clark, Laura; Béché, Armand; Verbeeck, Jo

Measuring the orbital angular momentum of electron beams

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American Physical Society (APS), 2014

Published in: Physical Review A, 89 (2014) 2
Verbeeck, Jo; Béché, Armand; Van den Broek, Wouter

A holographic method to measure the source size broadening in STEM

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Elsevier BV, 2012

Published in: Ultramicroscopy, 120 (2012), Seite 35-40
Cooper, David; Le Royer, Cyrille; Béché, Armand; Rouvière, Jean-Luc

Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy

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AIP Publishing, 2012

Published in: Applied Physics Letters, 100 (2012) 23
Esteban, Daniel Arenas; Vanrompay, Hans; Skorikov, Alexander; Béché, Armand; Verbeeck, Johan; Freitag, Bert; Bals, Sara

Fast electron low dose tomography for beam sensitive materials

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Oxford University Press (OUP), 2021

Published in: Microscopy and Microanalysis, 27 (2021) S1, Seite 2116-2118
Van Aert, Sandra; De Backer, Annick; Jones, Lewys; Martinez, Gerardo T.; Béché, Armand; Nellist, Peter D.

Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy

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American Physical Society (APS), 2019

Published in: Physical Review Letters, 122 (2019) 6
Guzzinati, Giulio; Ghielens, Wannes; Mahr, Christoph; Béché, Armand; Rosenauer, Andreas; Calders, Toon; Verbeeck, Jo

Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping

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AIP Publishing, 2019

Published in: Applied Physics Letters, 114 (2019) 24
Jannis, Daen; Müller-Caspary, Knut; Béché, Armand; Oelsner, Andreas; Verbeeck, Johan

Spectroscopic coincidence experiments in transmission electron microscopy

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AIP Publishing, 2019

Published in: Applied Physics Letters, 114 (2019) 14
Van den Broek, Wouter; Reed, Bryan W.; Beche, Armand; Velazco, Abner; Verbeeck, Johan; Koch, Christoph T.

Various Compressed Sensing Setups Evaluated Against Shannon Sampling Under Constraint of Constant Illumination

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Institute of Electrical and Electronics Engineers (IEEE), 2019

Published in: IEEE Transactions on Computational Imaging, 5 (2019) 3, Seite 502-514
Lepot, Kevin; Addad, Ahmed; Knoll, Andrew H.; Wang, Jian; Troadec, David; Béché, Armand; Javaux, Emmanuelle J.

Iron minerals within specific microfossil morphospecies of the 1.88 Ga Gunflint Formation

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Springer Science and Business Media LLC, 2017

Published in: Nature Communications, 8 (2017) 1
Guzzinati, Giulio; Béché, Armand; Lourenço-Martins, Hugo; Martin, Jérôme; Kociak, Mathieu; Verbeeck, Jo

Probing the symmetry of the potential of localized surface plasmon resonances with phase-shaped electron beams

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Springer Science and Business Media LLC, 2017

Published in: Nature Communications, 8 (2017) 1

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