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  1. Yun, Minghui; Yang, Daoguo; Cai, Miao; Yan, Haidong; Yu, Jiabing; Liu, Mengyuan; He, Siliang; Zhang, Guoqi

    Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance

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    Institute of Electrical and Electronics Engineers (IEEE), 2024

    Published in: IEEE Transactions on Device and Materials Reliability

  2. Kreger, Stephen T.; Ohanian, Osgar John; Garg, Naman; Castellucci, Matthew A.; Kominski, Dan; Rahim, Nur Aida Abdul; Davis, Matthew A.; Beaty, Noah B.; Jeans, James W.; Templeton, Emily H.; Pedrazzani, J. R.

    Optical frequency domain reflectometry for aerospace applications

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    SPIE, 2017

    Published in: SPIE Proceedings