@book
{TN_libero_mab2,
author = {
Sharma, Ashok K.
},
title = {
Semiconductor memories
technology, testing, and reliability
},
publisher = {IEEE Press},
isbn = {0780310004},
keywords = {
Semiconductor storage devices
,
Halbleiterspeicher
},
year = {1997},
abstract = {Literaturangaben},
address = {
Piscataway, NJ
},
url = {
http://slubdd.de/katalog?TN_libero_mab2
}
}