author = { Wang, Laung-Terng AND Wu, Cheng-Wen EE Ph. D },

title = { VLSI test principles and architectures design for testability },

publisher = {Elsevier},

isbn = {0123705975},

isbn = {9780123705976},

keywords = { Integrated circuits Very large scale integration Testing , Integrated circuits Very large scale integration Design , VLSI , Testen },

year = {2006},

abstract = {Includes bibliographical references and index},

abstract = {Hier auch später erschienene, unveränderte Nachdrucke},

booktitle = {The Morgan Kaufmann series in systems on silicon},

address = { Amsterdam },

url = { http://slubdd.de/katalog?TN_libero_mab2 }