%0 Book
%T VLSI test principles and architectures design for testability
%A Wang, Laung-Terng
%A Wu, Cheng-Wen EE Ph. D
%I Elsevier
%@ 0123705975
%@ 9780123705976
%K Integrated circuits Very large scale integration Testing
%K Integrated circuits Very large scale integration Design
%K VLSI
%K Testen
%D 2006
%X Includes bibliographical references and index
%X Hier auch später erschienene, unveränderte Nachdrucke
%C Elsevier
%C Amsterdam
%U http://slubdd.de/katalog?TN_libero_mab2
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