%0
Book
%T
VLSI test principles and architectures
design for testability
%A Wang, Laung-Terng
%A Wu, Cheng-Wen EE Ph. D
%I Elsevier
%@ 0123705975
%@ 9780123705976
%K Integrated circuits Very large scale integration Testing
%K Integrated circuits Very large scale integration Design
%K VLSI
%K Testen
%D 2006
%X Includes bibliographical references and index
%X Hier auch später erschienene, unveränderte Nachdrucke
%C Elsevier
%C Amsterdam
%U http://slubdd.de/katalog?TN_libero_mab2