TY - BOOK
AU - Wang, Laung-Terng
AU - Wu, Cheng-Wen EE Ph. D
TI - VLSI test principles and architectures design for testability
PB - Elsevier
SN - 0123705975
SN - 9780123705976
KW - Integrated circuits Very large scale integration Testing
KW - Integrated circuits Very large scale integration Design
KW - VLSI
KW - Testen
PY - 2006
N2 - Includes bibliographical references and index
N2 - Hier auch später erschienene, unveränderte Nachdrucke
BT - The Morgan Kaufmann series in systems on silicon
CY - Amsterdam
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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