TY - GEN
AU - JEDEC, Solid State Technology Association Committee on GaAs Reliability and Quality Standards
AU - IEEE Electron Devices Society
TI - Reliability of compound semiconductors digest ROCS Workshop, 2007 ; 14 Oct. 2007, Portland, Oregon
PB - IEEE
SN - 0790801159
SN - 9780790801155
KW - Semiconductors Congresses
KW - Semiconductors Reliability Congresses
KW - Gallium arsenide semiconductors Congresses
KW - Konferenzschrift
PY - 2007
N2 - IEEE catalog number: 07TH8986
N2 - Parallel als Buch-Ausg. erschienen
CY - Piscataway, NJ
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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