TY - BOOK
AU - Shimizu, Kenichi
AU - Mitani, Tomoaki
TI - New horizons of applied scanning electron microscopy
PB - Springer
SN - 3642031595
SN - 9783642031595
SN - 9783642261688
KW - Scanning electron microscopy Technique
KW - Scanning electron microscopy
KW - Rasterelektronenmikroskopie
KW - Feldemissionsmikroskopie
KW - Probenvorbereitung
KW - Hochfrequenzsputtern
PY - 2010
BT - Springer series in surface sciences ; 45
CY - Berlin
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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