TY - BOOK
AU - Stanisavljevic, Milos
AU - Schmid, Alexandre
AU - Leblebici, Yusuf
TI - Reliability of nanoscale circuits and systems methodologies and circuit architectures
ET - 1. ed.
PB - Springer
SN - 9781441962164
SN - 1441962166
KW - Nanoelectromechanical systems Reliability
KW - Nanoelectronics
KW - Nanoelectromechanical systems
KW - Reliability
PY - c 2011
N2 - Literaturverz. S. 177 - 190
CY - New York
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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