@book
{TN_libero_mab2,
author = {
Tan, Cher Ming
},
title = {
Electromigration in ULSI interconnections
},
publisher = {World Scientific},
isbn = {9789814273329},
isbn = {9814273325},
keywords = {
Integrated circuits Ultra large scale integration
,
Electrodiffusion
},
year = {2010},
abstract = {The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf},
abstract = {Literaturangaben},
booktitle = {International series on advances in solid state electronics and technology},
address = {
New Jersey, NJ [u.a.]
},
url = {
http://slubdd.de/katalog?TN_libero_mab2
}
}