TY -
BOOK
AU - Tan, Cher Ming
TI -
Electromigration in ULSI interconnections
PB - World Scientific
SN - 9789814273329
SN - 9814273325
KW - Integrated circuits Ultra large scale integration
KW - Electrodiffusion
PY - 2010
N2 - The color figures are available online at: http://www.ntu.edu.sg/home/ecmtan/color figures for Electromigration in ULSI Interconnections.pdf
N2 - Literaturangaben
BT - International series on advances in solid state electronics and technology
CY - New Jersey, NJ [u.a.]
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -