author = { Gan, Zhenghao AND Wong, Waisum AND Liou, Juin J. },

title = { Semiconductor process reliability in practice },

publisher = {McGraw-Hill},

isbn = {007175427X},

isbn = {9780071754279},

keywords = { Semiconductors Reliability },

year = {2013},

address = { New York [u.a.] },

url = { http://slubdd.de/katalog?TN_libero_mab2 }