%0 Book
%T Semiconductor process reliability in practice
%A Gan, Zhenghao
%A Wong, Waisum
%A Liou, Juin J.
%I McGraw-Hill
%@ 007175427X
%@ 9780071754279
%K Semiconductors Reliability
%D 2013
%C McGraw-Hill
%C New York [u.a.]
%U http://slubdd.de/katalog?TN_libero_mab2
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