TY -
BOOK
AU - Gan, Zhenghao
AU - Wong, Waisum
AU - Liou, Juin J.
TI -
Semiconductor process reliability in practice
PB - McGraw-Hill
SN - 007175427X
SN - 9780071754279
KW - Semiconductors Reliability
PY - 2013
CY - New York [u.a.]
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -