author = { Goldstein, Joseph AND Newbury, Dale E. AND Michael, Joseph R. AND Ritchie, Nicholas W. M. AND Scott, John Henry J. AND Joy, David C. },

title = { Scanning electron microscopy and X-ray microanalysis },

edition = { Fourth edition } ,

publisher = {Springer},

publisher = {},

isbn = {9781493966745},

isbn = {9781493982691},

keywords = { Scanning electron microscopy , X-ray microanalysis , Elektronenstrahlmikroanalyse , Rasterelektronenmikroskopie , Röntgenstrahlmikroanalyse },

year = {[2018]},

abstract = {Hier auch später erschienene, unveränderte Nachdrucke},

abstract = {Electron beam-specimen interactions -- Backscattered electrons -- Secondary electrons -- X-rays -- SEM instrumentation -- Image formation -- SEM image interpretation -- The visibility of features in SEM images -- Image defects -- High resolution imaging -- Low beam energy SEM -- Variable pressure SEM (VPSEM) -- ImageJ and Fiji -- SEM imaging checklist -- SEM case studies -- Energy dispersive X-ray spectrometry -- DTSA-II EDS software -- Qualitative elemental analysis by energy dispersive X-ray spectrometry -- Quantitative analysis -- Trace analysis by SEM/EDS -- Low beam energy X-ray microanalysis -- Analysis of specimens with special geometry -- Compositional mapping -- Attempting electron-excited X-ray microanalysis in the variable pressure scanning electron microscope (VPSEM) -- Energy dispersive X-ray microanalysis checklist -- Case studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused ion beam application in the SEM laboratory -- Ion beam microscopy},

address = { New York, NY, U.S.A. , },

url = { http://slubdd.de/katalog?TN_libero_mab2 }