@misc
{TN_libero_mab2,
author = {
International Reliability Physics Symposium (18th :1980 :Las Vegas, Nev.)
AND
IEEE Electron Devices Society
AND
IEEE Reliability Society
},
title = {
Reliability physics 1980
18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980
},
publisher = {Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers},
keywords = {
Integrated circuits Testing Congresses
,
Semiconductors Testing Congresses
,
Integrated circuits Reliability Congresses
,
Semiconductors Reliability Congresses
,
Konferenzschrift
},
year = {2011},
abstract = {"IEEE catalog no. 80CH1531-3},
abstract = {Includes bibliographical references},
abstract = {Use copy Restrictions unspecified star MiAaHDL},
address = {
New York
},
url = {
http://slubdd.de/katalog?TN_libero_mab2
}
}