%0 Generic
%T Reliability physics 1980 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980
%A International Reliability Physics Symposium (18th :1980 :Las Vegas, Nev.)
%A IEEE Electron Devices Society
%A IEEE Reliability Society
%I Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers
%K Integrated circuits Testing Congresses
%K Semiconductors Testing Congresses
%K Integrated circuits Reliability Congresses
%K Semiconductors Reliability Congresses
%K Konferenzschrift
%D 2011
%X "IEEE catalog no. 80CH1531-3
%X Includes bibliographical references
%X Use copy Restrictions unspecified star MiAaHDL
%C Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers
%C New York
%U http://slubdd.de/katalog?TN_libero_mab2
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