TY - GEN
AU - International Reliability Physics Symposium (18th :1980 :Las Vegas, Nev.)
AU - IEEE Electron Devices Society
AU - IEEE Reliability Society
TI - Reliability physics 1980 18th annual proceedings : Las Vegas, Nevada, April 8-10, 1980
PB - Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers
KW - Integrated circuits Testing Congresses
KW - Semiconductors Testing Congresses
KW - Integrated circuits Reliability Congresses
KW - Semiconductors Reliability Congresses
KW - Konferenzschrift
PY - 2011
N2 - "IEEE catalog no. 80CH1531-3
N2 - Includes bibliographical references
N2 - Use copy Restrictions unspecified star MiAaHDL
CY - New York
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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