author = { GaAs Reliability Workshop (2000 :Seattle, Wash.) AND IEEE Electron Devices Society AND JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards },

title = { 2000 GaAs Reliability Workshop proceedings : November 5, 2000, Seattle, Washington },

publisher = {IEEE},

isbn = {0780350677},

isbn = {0790801027},

isbn = {9780780350670},

isbn = {9780790801025},

keywords = { Semiconductors Reliability Congresses , Gallium arsenide semiconductors Congresses , Semiconductors Materials Congresses , Konferenzschrift },

year = {2000},

abstract = {"IEEE Catalog Number: 00TH8513"--Title page verso},

abstract = {Includes bibliographical references},

address = { Piscataway, N.J },

url = { http://slubdd.de/katalog?TN_libero_mab2 }