TY - GEN
AU - Hermann, Peter
AU - Hecker, Michael
AU - Chumakov, Dmytro
AU - Weisheit, Martin
AU - Rinderknecht, Jochen
AU - Shelaev, Artem
AU - Dorozhkin, Pavel
AU - Eng, Lukas M.
TI - Imaging and strain analysis of nano-scale SiGe structures by tip-enhanced Raman spectroscopy
PB - Elsevier BV
SN - 0304-3991
KW - Instrumentation
KW - Atomic and Molecular Physics, and Optics
KW - Electronic, Optical and Magnetic Materials
PY - 2011
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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