@misc
{TN_libero_mab2,
author = {
Kalpat, S.
AND
Hsing-Huang Tseng
AND
Ramon, M.
AND
Moosa, M.
AND
Tekleab, D.
AND
Tobin, P.J.
AND
Gilmer, D.C.
AND
Hegde, R.I.
AND
Capasso, C.
AND
Tracy, C.
AND
White, B.E.
},
title = {
BTI characteristics and mechanisms of metal gated HfO/sub 2/ films with enhanced interface/bulk process treatments
},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
isbn = {1530-4388},
keywords = {
Electrical and Electronic Engineering
,
Safety, Risk, Reliability and Quality
,
Electronic, Optical and Magnetic Materials
},
year = {2005},
url = {
http://slubdd.de/katalog?TN_libero_mab2
}
}