%0 Generic
%T AC Variability and Endurance Measurement Technique for Resistive Switching Memories
%A Deora, S.
%A Bersuker, G.
%A Matthews, K.
%A Gilmer, D. C.
%A Kirsch, P. D.
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 1530-4388
%@ 1558-2574
%K Electrical and Electronic Engineering
%K Safety, Risk, Reliability and Quality
%K Electronic, Optical and Magnetic Materials
%D 2014
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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