author = { Huang, Daming AND Liu, W. J. AND Liu, Zhiying AND Liao, C. C. AND Zhang, Li-Fei AND Gan, Zhenghao AND Wong, Waisum AND Li, Ming-Fu },

title = { A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs },

publisher = {Institute of Electrical and Electronics Engineers (IEEE)},

isbn = {0018-9383},

keywords = { Electrical and Electronic Engineering , Electronic, Optical and Magnetic Materials },

year = {2009},

url = { http://slubdd.de/katalog?TN_libero_mab2 }