%0 Generic
%T A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs
%A Huang, Daming
%A Liu, W. J.
%A Liu, Zhiying
%A Liao, C. C.
%A Zhang, Li-Fei
%A Gan, Zhenghao
%A Wong, Waisum
%A Li, Ming-Fu
%I Institute of Electrical and Electronics Engineers (IEEE)
%@ 0018-9383
%K Electrical and Electronic Engineering
%K Electronic, Optical and Magnetic Materials
%D 2009
%C Institute of Electrical and Electronics Engineers (IEEE)
%U http://slubdd.de/katalog?TN_libero_mab2
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