TY - GEN
AU - Huang, Daming
AU - Liu, W. J.
AU - Liu, Zhiying
AU - Liao, C. C.
AU - Zhang, Li-Fei
AU - Gan, Zhenghao
AU - Wong, Waisum
AU - Li, Ming-Fu
TI - A Modified Charge-Pumping Method for the Characterization of Interface-Trap Generation in MOSFETs
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 0018-9383
KW - Electrical and Electronic Engineering
KW - Electronic, Optical and Magnetic Materials
PY - 2009
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
Download citation