TY -
GEN
AU - Lee, R. Nackman
TI -
Two-Dimensional Critical Point Configuration Graphs
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 0162-8828
KW - Applied Mathematics
KW - Artificial Intelligence
KW - Computational Theory and Mathematics
KW - Computer Vision and Pattern Recognition
KW - Software
PY - 1984
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -