TY - GEN
AU - Spann, J.Y.
AU - Anderson, R.A.
AU - Thornton, T.J.
AU - Harris, G.
AU - Thomas, S.G.
AU - Tracy, C.
TI - Characterization of nickel Germanide thin films for use as contacts to p-channel Germanium MOSFETs
PB - Institute of Electrical and Electronics Engineers (IEEE)
SN - 0741-3106
KW - Electrical and Electronic Engineering
KW - Electronic, Optical and Magnetic Materials
PY - 2005
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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