TY - GEN
AU - Ettl, Peter
AU - Schmidt, Berthold E.
AU - Schenk, M.
AU - Laszlo, Ildiko
AU - Haeusler, Gerd
TI - Roughness parameters and surface deformation measured by coherence radar
PB - SPIE
SN - 0277-786X
PY - 1998
UR - http://slubdd.de/katalog?TN_libero_mab2
ER -
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