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Neuchatel: CSEM, 19XX-
Published in:European Space Agency contract report
Herndon, T. O.
[Other];
Herndon, Terry O.
[Editor]
;
Electrochemical Society Dielectric Science and Technology Division,
Symposium on Interconnects, Contact Metallization, and Multilevel Metallization 3 1993 Honolulu, Hawaii,
Symposium on Interconnects, Contact Metallization, and Multilevel Metallization 3 1993 Honolulu, Hawaii,
Symposium on Reliability for Semiconductor Devices, Interconnects, and Thin Insulator Materials 1993 Honolulu, Hawaii
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New York: Electron Devices Society and Reliability Society of the Institute of Electrical and Electronics Engineers, 2011 ;
[S.l.]: HathiTrust Digital Library
International Reliability Physics Symposium (16th :1978 :San Diego, Calif.),
IEEE Electron Devices Society,
IEEE Reliability Group