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  1. Auciello, Orlando [Editor]; Krauss, Alan Robert [Other]

    In situ real-time characterization of thin films

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    New York, NY; Weinheim [u.a.]: Wiley, 2001

    Published in: A Wiley-Interscience Publication

  2. Frey, Hartmut [Editor]; Kienel, Gerhard [Other]

    Dünnschichttechnologie

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    Düsseldorf: VDI-Verlag, 1987

  3. Chopra, Kasturi L. [Author]; Chopra, Kasturi Lal [Author]; Kaur, Inderjeet [Author] ; Kaur, Inderjeet [Other]

    Thin film device applications

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    New York [u.a.]: Plenum, 1983

  4. Thompson, Carl V. [Other]; Thompson, C. V. [Editor] ; Materials Research Society, Symposium on the Evolution of Thin Film and Surface Microstructure 1990 Boston, Mass

    Evolution of thin-film and surface microstructure : symposium held November 26 - December 1, 1990, Boston, Massachusetts, U.S.A.

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    Pittsburgh, Pa.: Materials Research Society, 1991

    Published in: Materials Research Society: Materials Research Society symposium proceedings ; 20200

  5. Kuo, Yue [Editor] ; Symposium on Thin Film Transistor Technologies 1 1992 Toronto, Electrochemical Society Dielectric Science and Technology Division, Electrochemical Society Electronics Division

    Proceedings of the First Symposium on Thin Film Transistor Technologies : [held in Toronto, Ontario, Canada, October 14 - 16, 1992]

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    Pennington, NJ: Electrochemical Society, 1992

    Published in: Electrochemical Society: Proceedings volume ; 92,24

  6. Bland, J. Anthony C. [Editor]; Heinrich, Bretislav [Editor]

    Ultrathin magnetic structures

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    Berlin; Heidelberg [u.a.]: Springer, 1994-

  7. Knoll, Wolfgang [Editor]

    Functional polymer films

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    Weinheim: Wiley-VCH, 20XX-

  8. Kapoor, Vik J. [Editor]; Hankins, Kevin T. [Other] ; Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films 2 1986 San Diego, Calif

    Proceedings of the Symposium Silicon Nitride and Silicon Dioxide Thin Insulating Films : [held October 20 - 24, 1986, in San Diego, Calif.]

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    Pennington, NJ: Electrochemical Society, 1987

    Published in: Electrochemical Society: Proceedings volume ; 87,10