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  1. Mann, Nancy R. [Author]; Schafer, Ray E. [Author]; Singpurwalla, Nozer D. [Author]

    Methods for statistical analysis of reliability and life data

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    New York [u.a.]: Wiley, 1974

    Published in: Wiley series in probability and mathematical statistics ; Applied probability and statistics- Wiley series in probability and mathematical statistics

  2. Gercbach, Ilʹja B. [Author] ; Kordonskij, Chaim B. [Other]; Gercbach, Il'ja Boruchovič [Other]

    Models of failure

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    Berlin, Heidelberg, New York: Springer, 1969

    Published in: Ingenieurwissenschaftliche Bibliothek

  3. Woschni, Eugen-Georg [Author]

    Näherungsbetrachtungen contra Computerlösungen? : Ein Beitrag zur Diskussion über Lehrinhalte ; [Vortrag gehalten auf der Plenarsitzung der Sächsischen Akademie der Wissenschaften zu Leipzig, am 13.1.2012]

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    Stuttgart; Leipzig: Hirzel, 2012 ; Leipzig: Sächsische Akad. der Wiss., 2012

    Published in: Sächsische Akademie der Wissenschaften zu Leipzig: Sitzungsberichte der Sächsischen Akademie der Wissenschaften zu Leipzig, Technikwissenschaftliche Klasse ; 306

  4. Høyland, Arnljot [Author]; Rausand, Marvin [Author]

    System reliability theory : models and statistical methods - [2. print.]

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    New York [u.a.]: Wiley, c1994

    Published in: Wiley series in probability and mathematical statistics ; Applied probability and statistics section- A Wiley-Interscience publication

  5. Rathore, Hazara S. [Editor]; Mathad, G. S. [Other] ; Symposium on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown 1991 Phoenix, Ariz, Electrochemical Society, Electrochemical Society Dielectric Science and Technology Division, Electrochemical Society Electronics Division, Symposium on Laser Process for Microelectronic Applications 1991 Phoenix, Ariz

    Proceedings of the Symposia on Reliability of Semiconductor Devices-Interconnections and Dielectric Breakdown and Laser Process for Microelectronic Applications : [... joint volume of conference papers]

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    Pennington, NJ: Electrochemical Society, 1992

    Published in: Electrochemical Society: Proceedings volume ; 92,4