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Nakagawa, Toshio [Author]

Stochastic processes : with applications to reliability theory

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London; Heidelberg [u.a.]: Springer, 2011

Published in: Springer series in realibility engineering
Nikolaidis, Efstratios [Editor]; Ghiocel, Dan M. [Editor]; Singhal, Suren [Editor]

Engineering design reliability applications : for the aerospace, automotive, and ship industries

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Boca Raton, Fla.[u.a.]: CRC/Taylor & Francis, 2008
Tabata, Osamu [Editor]; Tsuchiya, Toshiyuki [Other]

Reliability of MEMS : [testing of materials and devices]

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Weinheim: Wiley-VCH, 2008

Published in: Advanced micro & nanosystems ; 6
Goloubeva, Olga [Other]

Software-implemented hardware fault tolerance - [softcover repr. of the hardcover 1 st. ed. 2006]

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New York, NY: Springer, 2006
Jensen, Christian [Editor] ; International Conference on Trust Management 2 2004 Oxford

Trust management : second international conference, iTrust 2004, Oxford, UK, March 29 - April 1, 2004 ; proceedings

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Berlin; Heidelberg [u.a.]: Springer, 2004

Published in: Lecture notes in computer science ; 2995
Balakrishnan, Narayanaswamy [Editor]

Advances in reliability - [1. ed.]

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Amsterdam [u.a.]: Elsevier, 2001

Published in: Handbook of statistics ; 20
O'Connor, Patrick D. T. [Author] ; Newton, David [Other]

Practical reliability engineering - [4. ed.]

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Chichester [u.a.]: Wiley, 2002
Ayyub, Bilal M. [Author]; McCuen, Richard H. [Author]

Probability, statistics, and reliability for engineers and scientists - [2. ed.]

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Boca Raton, Fla. [u.a.]: Chapman & Hall/CRC Press, c 2003
Schneeweiß, Winfrid G. [Author]

Reliability modeling : (modeling in the fields of dependability, availability, maintainability, and safety engineering)

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Hagen: LiLoLe-Verl., c2001 ; [Norderstedt]: Books on Demand GmbH, c2001
Peled, Doron [Author]

Software reliability methods

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New York, NY; Berlin; Heidelberg [u.a.]: Springer, c 2001

Published in: Texts in computer science
Goble, William M. [Author]

Control systems safety evaluation and reliability - [2. ed.]

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Research Triangle Park, NC: Instrument Society of America, 1998

Published in: Resources for measurement and control series
Tummala, Rao R. [Editor] ; Advanced Research Workshop on Electronic Packaging for High Reliability, Low Cost Electronics 1997 Bled

Electronic packaging for high reliability, low cost elctronics : [proceedings of the NATO Advanced Research Workshop on Electronic Packaging for High Reliability, Low Cost Electronics, Bled, Slovenia, May 10 - 13, 1997]

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Dordrecht [u.a.]: Kluwer Acad. Publ., 1999

Published in: NATO: NATO ASI series / Partnership sub-series / 3 ; 57
Siewiorek, Daniel P. [Author]; Swarz, Robert S. [Author]

Reliable computer systems : design and evaluation - [3. ed.]

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Natick, Mass: A K Peters, 1998
Ionescu, Dumitru Cezar [Other]; Limnios, Nikolaos [Other]; Ionescu, Dumitru C. [Editor] ; International Conference on Mathematical Methods in Reliability 1 1997 Bukarest

Statistical and probabilistic models in reliability : [... presented at the 1st International Conference on Mathematical Methods in Reliability held at the Politehnica University of Bucharest from 16 to 19 September 1997]

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Boston; Berlin [u.a.]: Birkhäuser, 1999

Published in: Statistics for industry and technology
Ayyub, Bilal M. [Author] ; McCuen, Richard H. [Other]

Probability, statistics, & reliability for engineers

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Boca Raton, Fla. [u.a.]: CRC Press, 1997
Oates, Anthony S. [Other]

Materials reliability in microelectronics / 5, Symposium held April 17 - 21, 1995, San Francisco, California,U.S.A./eds.: Anthony S. Oates

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Pittsburgh, Pa.: Materials Research Society, 1995

Published in: Materials reliability in microelectronics ; 5 - Materials Research Society: Materials Research Society symposium proceedings ; 391
Pham, Hoang [Editor]

Software reliability and testing

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Los Alamitos, Calif. [u.a.]: IEEE Computer Society Press, 1995
Beck, Friedrich [Author]

Integrierte Halbleiterschaltungen : Konstruktionsmerkmale, Fehlererscheinungen, Ausfallmechanismen

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Weinheim [u.a.]: VCH, 1993
Børgesen, Peter [Other]

Materials reliability in microelectronics / 4, Symposium held April 5 - 8, 1994, San Francisco, California,U.S.A./eds.: Peter Børgesen

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Pittsburgh, Pa.: Materials Research Society, 1994

Published in: Materials reliability in microelectronics ; 4 - Materials Research Society: Materials Research Society symposium proceedings ; 338
Muhlbauer, W. K. [Author]; Muhlbauer, W. Kent [Author]

Pipeline risk management manual

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Houston [u.a.]: Gulf Pub. Co, 1992

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