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  1. Băjenescu, Titu I. [Author]; Bâzu, Marius I. [Author] ; Băjenescu, Titu-Marius I. [Other]

    Component reliability for electronic systems

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    Boston, Mass. [u.a.]: Artech House, 2010

  2. Vashchenko, Vladislav A. [Author]; Shibkov, Andrei [Author]

    ESD design for analog circuits

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    New York, NY; Heidelberg [u.a.]: Springer, 2010

  3. Fleetwood, Daniel M. [Author] ; Pantelides, Sokrates T. [Other]; Schrimpf, Ronald D. [Other]; Pantelides, Sokrates [Other]; Schrimpf, Ronald Donald [Other]

    Defects in microelectronic materials and devices

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    Boca Raton, Fla. [u.a.]: CRC Press, 2009

  4. Sattler, Sebastian [Other] ; Gesellschaft Mikroelektronik, Mikro- und Feinwerktechnik, Informationstechnische Gesellschaft, Tagung Zuverlässigkeit und Entwurf 2008 Ingolstadt

    Zuverlässigkeit und Entwurf : 2. GMM/GI/ITG-Fachtagung vom 29. September bis 1. Oktober 2008 in Ingolstadt

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    Berlin; Offenbach: VDE-Verl., 2008

    Published in: Gesellschaft Mikroelektronik, Mikro- und Feinwerktechnik: GMM-Fachbericht ; 57

  5. Kaiser, Kenneth L. [Author]

    Electrostatic discharge

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    Boca Raton, Fla.: CRC, 2005 ; London: Taylor & Francis, 2005

  6. Kaiser, Kenneth L. [Author]

    Electrostatic discharge

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    Boca Raton, Fla. [u.a.]: CRC Press/Taylor & Francis, 2006

  7. Voldman, Steven H. [Author]

    ESD : RF technology and circuits

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    Chicester [u.a.]: Wiley, 2006