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  1. Herder, Matthias; Ernst, Philipp; Breuer, Lars; Bender, Markus; Severin, Daniel; Wucher, Andreas

    Secondary ion formation on indium under nuclear and electronic sputtering conditions

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    American Vacuum Society, 2018

    Published in: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

  2. Breuer, Lars; Meinerzhagen, Florian; Herder, Matthias; Bender, Markus; Severin, Daniel; Lerach, Jordan O.; Wucher, Andreas

    Secondary ion and neutral mass spectrometry with swift heavy ions: Organic molecules

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    American Vacuum Society, 2016

    Published in: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

  3. Liebermeister, Lars; Nellen, Simon; Kohlhaas, Robert B.; Lauck, Sebastian; Deumer, Milan; Breuer, Steffen; Schell, Martin; Globisch, Björn

    Terahertz Multilayer Thickness Measurements: Comparison of Optoelectronic Time and Frequency Domain Systems

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    Springer Science and Business Media LLC, 2021

    Published in: Journal of Infrared, Millimeter, and Terahertz Waves