Skip to contents

Xu, Baowen [Organizer]; Chu, William Cheng-Chung [Organizer] ; International Conference on Trustworthy Systems and their Applications 3. 2016 Wuhan, IEEE Reliability Society

2016 Third International Conference on Trustworthy Systems and their Applications : TSA 2016 : 18-20 September 2016, Wuhan, Hubei, China : proceedings

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=7777701

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2016
Zuo, Ming J. [Editor] ; Prognostics and System Health Management Conference 2016 Chengdu, IEEE Reliability Society

Proceedings of 2016 Prognostics and System Health Management Conference (PHM-Chengdu) : October 19-21, 2016, Chengdu, Sichuan, China

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=7810913

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

[Piscataway, NJ]: IEEE, 2016
Wang, Zili [Editor]; Zhang, Shunong [Editor] ; ICRSE 1. 2015 Peking, IEEE Reliability Society

2015 ICRSE : 21-23 October 2015, Vision Hotel, Beijing, China : proceedings of the 2015 First International Conference on Reliability Systems Engineering

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=7356450

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

[Piscataway, NJ]: IEEE, 2015
DCIT 2. 2015 Wuhan, IEEE Reliability Society

2015 Second International Symposium on Dependable Computing and Internet of Things : DCIT 2015 : 16-19 November 2015, Wuhan, Hubei, China : proceedings

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=7434374

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2015
International Symposium on Rapid System Prototyping 26. 2015 Amsterdam, IEEE Reliability Society

Shortening the path from specification to prototype : proceedings of the 2015 26th International Symposium on Rapid System Prototyping : October 8-9, 2015, Amsterdam, The Netherlands

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=7411942

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

[Piscataway, NJ]: IEEE, 2015
International Symposium on System Security, Safety, and Reliability 8. 2022 Online, IEEE Reliability Society

2022 8th International Symposium on System Security, Safety, and Reliability : ISSSR 2022 : 27-28 October 2022, Chongqing, China : proceedings

View online
Schließen

Access

Full access (via DOI)

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2022
IEEE, Reliability Society Staff

1995 Annual Reliability and Maintainability Symposium

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=3884

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway: IEEE, 1995
Turner, Andrew A. [Other] ; IEEE Electron Devices Society, IEEE Reliability Society

2012 IEEE International Integrated Reliability Workshop final report (IRW) : 14 - 18 Oct. 2012 ; Stanford Sierra Conference Center, S. Lake Tahoe, California

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=6457539

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2012
Geilenkeuser, Rolf [Other] ; IEEE Electron Devices Society, IEEE Reliability Society

2011 IEEE International Integrated Reliability Workshop final report (IRW) : 16 - 20 Oct. 2011 ; Stanford Sierra Conference Center, S. Lake Tahoe, California ; 30th anniversary of IIRW

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=6138496

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2011
IEEE Electron Devices Society, IEEE Reliability Society

IEEE International Integrated Reliability Workshop final report (IRW), 2010 : S. Lake Tahoe, California, USA, 17 - 21 Oct. 2010

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=5700633

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2010
Tao, Guoqiao [Other] ; IEEE Electron Devices Society, IEEE Reliability Society

IEEE International Integrated Reliability Workshop final report, 2009 : IRW'09 ; 18 - 22 Oct. 2009 ; Stanford Sierra Conference Center, S. Lake Tahoe, California

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=5372396

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2009
IEEE Electron Devices Society, IEEE Reliability Society

IEEE International Integrated Reliability Workshop final report, 2008 : 12 - 16 Oct. 2008, Stanford Sierra Conference Center, S. Lake Tahoe, California

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=4784682

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2008
IEEE Electron Devices Society, IEEE Reliability Society

IEEE International Reliability Physics Symposium, 2008 : IRPS 2008 ; 46th annual ; April 27, 2008 - May 1, 2008, Phoenix, Arizona

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=4550747

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2008
IEEE Electron Devices Society, IEEE Reliability Society

Proceedings / IEEE International Reliability Physics Symposium, 2007 : 45th annual ; 15 - 19 April 2007, [Phoenix, Arizona]

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=4227591

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE Service Center, 2007
IEEE Electron Devices Society, IEEE Reliability Society

IEEE International Reliability Physics Symposium proceedings, 2006 : [March 26 - 30, 2006, San Jose, California ; 44th annual]

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=4017118

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE Service Center, 2006
Podgurski, Andrew [Other] ; Infosys Technologies Limited Bangalore, IEEE Reliability Society

20th International Symposium on Software Reliability Engineering, 2009 : ISSRE '09 ; 16 - 19 Nov. 2009, Mysuru, Karnataka, India ; [research papers]

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=5361941

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2009
International Workshop on Rapid System Prototyping 31. 2020 Online, IEEE Reliability Society

Proceedings of the 2020 31st International Workshop on Rapid System Prototyping: Shortening the path from specification to prototype : September 24, 2020, virtual conference

View online
Schließen

Access

Full access (via DOI)

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

[Piscataway, NJ]: IEEE, 2020
Web Information Systems and Applications Conference 13. 2016 Wuhan, IEEE Reliability Society

13th Web Information Systems and Applications Conference - WISA 2016 : proceedings : in conjunction with 1st Symposium on Big Data Processing and Analysis (BDPA 2016), 1st Workshop on Information System Security (ISS 2016) : 23-25 September 2016, Wuhan, Hubei, China

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=7782004

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2016
Zio, Enrico [Organizer]; Gu, Jicheng [Editor] ; International Conference on System Reliability and Safety 6. 2022 Venedig; Online, IEEE Reliability Society

2022 6th International Conference on System Reliability and Safety (ICSRS) : November 23-25, 2022, Venice, Italy

View online
Schließen

Access

Full access (via DOI)

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway, NJ: IEEE, 2022
IEEE, Reliability Society Staff, IEEE, Society Staff

Reliability and Maintainability Symposium, 1994

View online
Schließen

Access

http://ieeexplore.ieee.org/servlet/opac?punumber=1101

Show more show less

Close

Bookmarks

You can manage bookmarks using lists, please log in to your user account for this.

Piscataway: IEEE, 1994

You did not find what you were looking for?

Purchase suggestion
Are you missing something you need for your research? If you have any suggestions please share them here.

Interlibrary Loan
Please search and order your favorite title in the Interlibrary Loan Portal.

Search in field:

Recently searched for:

You did not find what you were looking for?

> Year of publication

Year of publication