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Christodoulou, Christos G.; Huang, J.; Georgiopoulos, Michael; Liou, Juin J.

Design of gratings and frequency-selective surfaces using ARTMAP neural networks

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SPIE, 1994

Published in: SPIE Proceedings
Guo, Jialiang; Wang, Fang; Liou, Juin J.; Liu, Yuhuai

Preparation and Tribological Properties of a Superhydrophobic TB6 Titanium Alloy

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FapUNIFESP (SciELO), 2023

Published in: Materials Research
Khan, Sajid Ullah; Wang, Fang; Liou, Juin. J.; Liu, Yuhuai

Segmentation of breast tumors using cutting-edge semantic segmentation models

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Informa UK Limited, 2023

Published in: Computer Methods in Biomechanics and Biomedical Engineering: Imaging & Visualization
Liu, Wentao; Chiang, Te-Kuang; Yan, Yan; Liou, Juin J

Analytical subthreshold current model of the dual-material tri-gate (DMTG) MOSFET and its application for subthreshold logic gate

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IOP Publishing, 2022

Published in: Engineering Research Express
Guo, Jialiang; Wang, Fang; Liou, Juin J.; Liu, Yuhuai

Tribological properties of picosecond laser-textured titanium alloys under different lubrication conditions

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Institute of Physical Optics, 2022

Published in: Ukrainian Journal of Physical Optics
Jia, Ze; Wu, Xiao; Zhang, Mingming; Liou, Juin J.

Study on leakage current properties of BiFeO3 thin films with Pb(Zr,Ti)O3 buffer layer

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Informa UK Limited, 2016

Published in: Ferroelectrics
Deng, Wanling; Huang, Junkai; Ma, Xiaoyu; Liou, Juin J.

An Explicit Surface Potential Calculation and Compact Current Model for AlGaN/GaN HEMTs

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Institute of Electrical and Electronics Engineers (IEEE), 2015

Published in: IEEE Electron Device Letters
Liang, Hailian; Gu, Xiaofeng; Dong, Shurong; Liou, Juin J.

RC-Embedded LDMOS-SCR With High Holding Current for High-Voltage I/O ESD Protection

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Institute of Electrical and Electronics Engineers (IEEE), 2015

Published in: IEEE Transactions on Device and Materials Reliability
Xi, Yunfeng; Malobabic, Slavica; Vashchenko, Vladislav; Liou, Juin J.

Miscorrelation Between Air Gap Discharge and Human Metal Model Stresses Due to Multi-Finger Turn-On Effect

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Institute of Electrical and Electronics Engineers (IEEE), 2014

Published in: IEEE Transactions on Device and Materials Reliability
Liu, Jizhi; Liu, Zhiwei; Jia, Ze; Liou, Juin. J.

A novel DTSCR with a variation lateral base doping structure to improve turn-on speed for ESD protection

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IOP Publishing, 2014

Published in: Journal of Semiconductors
Lai, Chao Sung; Liou, Juin J.; Wang, Jer-Chyi

Editorial

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Elsevier BV, 2012

Published in: Solid-State Electronics
Aliaj, Blerina; Vashchenko, Vladislav A.; Shibkov, Andrei; Liou, Juin J.

Self-protection capability of integrated NLDMOS power arrays in ESD pulse regimes

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Elsevier BV, 2011

Published in: Microelectronics Reliability
Liu, Xiang; Yuan, Jiann-shiun; Liou, Juin J.

Thermal reliability of VCO using InGaP/GaAs HBTs

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Elsevier BV, 2011

Published in: Microelectronics Reliability
Liu, Xiang; Yuan, Jiann-shiun; Liou, Juin J.

Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance

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Elsevier BV, 2010

Published in: Microelectronics Reliability
Li, You; Liou, Juin J.; Vinson, James E.; Zhang, Lining

Investigation of LOCOS- and Polysilicon-Bound Diodes for Robust Electrostatic Discharge (ESD) Applications

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Institute of Electrical and Electronics Engineers (IEEE), 2010

Published in: IEEE Transactions on Electron Devices
Zhiwei Liu; Liou, Juin J; Shurong Dong; Yan Han

Silicon-Controlled Rectifier Stacking Structure for High-Voltage ESD Protection Applications

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Institute of Electrical and Electronics Engineers (IEEE), 2010

Published in: IEEE Electron Device Letters
Lou, Lifang; Liou, Juin J.; Dong, Shurong; Han, Yan

Silicon controlled rectifier (SCR) compact modeling based on VBIC and Gummel–Poon models

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Elsevier BV, 2009

Published in: Solid-State Electronics
Liu, Xiang; Yuan, Jiann S.; Liou, Juin J.

InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability

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Elsevier BV, 2008

Published in: Microelectronics Reliability
Ding, Hao; Liou, Juin J.; Cirba, Claude R.; Green, Keith

An improved junction capacitance model for junction field-effect transistors

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Elsevier BV, 2006

Published in: Solid-State Electronics
Ding, Hao; Liou, Juin J.; Green, Keith; Cirba, Claude R.

A new model for four-terminal junction field-effect transistors

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Elsevier BV, 2006

Published in: Solid-State Electronics

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