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  1. Baoguang Yan; Jingfeng Yang; Zhiliang Xia; Xiaoyan Liu; Gang Du; Ruqi Han; Jinfeng Kang; Liao, C.C.; Zhenghao Gan; Miao Liao; Wang, J.P.; Waisum Wong

    Anomalous Negative Bias Temperature Instability Degradation Induced by Source/Drain Bias in Nanoscale PMOS Devices

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    Institute of Electrical and Electronics Engineers (IEEE), 2008

    Published in: IEEE Transactions on Nanotechnology