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Alles, Jonathan [Author] ; Rajewsky, Nikolaus [Other]; Landthaler, Markus [Other]; Wahle, Elmar [Other]

Poly(A) Tail Regulation in the Nucleus

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Berlin: Humboldt-Universität zu Berlin, 2022
Alles, Jonathan [Author] ; Rajewsky, Nikolaus [Other]; Landthaler, Markus [Other]; Wahle, Elmar [Other]

Poly(A) Tail Regulation in the Nucleus

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http://edoc.hu-berlin.de/18452/25348

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Berlin: Humboldt-Universität zu Berlin, 2022
Alles, Jonathan; Legnini, Ivano; Pacelli, Maddalena; Rajewsky, Nikolaus

Rapid nuclear deadenylation of mammalian messenger RNA

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Elsevier BV, 2023

Published in: iScience
Legnini, Ivano; Alles, Jonathan; Karaiskos, Nikos; Ayoub, Salah; Rajewsky, Nikolaus

FLAM-seq: full-length mRNA sequencing reveals principles of poly(A) tail length control

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Springer Science and Business Media LLC, 2019

Published in: Nature Methods
Uscher-Pines, Lori; Chernak, Esther; Alles, Steven; Links, Jonathan

College and University Planning for Pandemic Influenza: A Survey of Philadelphia Schools

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Mary Ann Liebert Inc, 2007

Published in: Biosecurity and Bioterrorism: Biodefense Strategy, Practice, and Science
Preussner, Marco; Santos, Karine F.; Alles, Jonathan; Heroven, Christina; Heyd, Florian; Wahl, Markus C.; Weber, Gert

Structural and functional investigation of the human snRNP assembly factor AAR2 in complex with the RNase H-like domain of PRPF8

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International Union of Crystallography (IUCr), 2022

Published in: Acta Crystallographica Section D Structural Biology
Karaiskos, Nikos; Wahle, Philipp; Alles, Jonathan; Boltengagen, Anastasiya; Ayoub, Salah; Kipar, Claudia; Kocks, Christine; Rajewsky, Nikolaus; Zinzen, Robert P.

The Drosophila embryo at single-cell transcriptome resolution

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American Association for the Advancement of Science, 2017

Published in: Science
Karaiskos, Nikos; Wahle, Philipp; Alles, Jonathan; Boltengagen, Anastasiya; Ayoub, Salah; Kipar, Claudia; Kocks, Christine; Rajewsky, Nikolaus; Zinzen, Robert P.

The Drosophila embryo at single-cell transcriptome resolution

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American Association for the Advancement of Science (AAAS), 2017

Published in: Science
Liu, Haiyue; Arsiè, Roberto; Schwabe, Daniel; Schilling, Marcel; Minia, Igor; Alles, Jonathan; Boltengagen, Anastasiya; Kocks, Christine; Falcke, Martin; Friedman, Nir; Landthaler, Markus; Rajewsky, Nikolaus

SLAM‐Drop‐seq reveals mRNA kinetic rates throughout the cell cycle

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Springer Science and Business Media LLC, 2023

Published in: Molecular Systems Biology
Wilcox, Edward P.; Breeding, Matthew L.; Casey, Megan C.; Pellish, Jonathan A.; Reed, Robert A.; Alles, Michael L.; Schrimpf, Ronald D.

Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory

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Institute of Electrical and Electronics Engineers (IEEE), 2021

Published in: IEEE Transactions on Nuclear Science
Alles, Jonathan; Karaiskos, Nikos; Praktiknjo, Samantha D.; Grosswendt, Stefanie; Wahle, Philipp; Ruffault, Pierre-Louis; Ayoub, Salah; Schreyer, Luisa; Boltengagen, Anastasiya; Birchmeier, Carmen; Zinzen, Robert; Kocks, Christine; Rajewsky, Nikolaus

Cell fixation and preservation for droplet-based single-cell transcriptomics

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Springer Science and Business Media LLC, 2017

Published in: BMC Biology
Ramachandran, Vishwanath; Gadlage, Matthew J.; Ahlbin, Jonathan R.; Narasimham, Balaji; Alles, Michael L.; Reed, Robert A.; Bhuva, Bharat L.; Massengill, Lloyd W.; Black, Jeffrey D.; Foster, Christopher N.

Application of a novel test system to characterize single-event effects at cryogenic temperatures

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Elsevier BV, 2010

Published in: Solid-State Electronics
Sutton, Akil. K.; Moen, Kurt; Cressler, John D.; Carts, Martin A.; Marshall, Paul W.; Pellish, Jonathan A.; Ramachandran, Vishwa; Reed, Robert A.; Alles, Michael L.; Niu, Guofu

Proton-induced SEU in SiGe digital logic at cryogenic temperatures

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Elsevier BV, 2008

Published in: Solid-State Electronics
Gorchichko, Mariia; Zhang, En Xia; Reaz, Mahmud; Li, Kan; Wang, Peng Fei; Cao, Jingchen; Brewer, Rachel M.; Schrimpf, Ronald D.; Reed, Robert A.; Sierawski, Brian D.; Alles, Michael L.; Cox, Jonathan; Moran, Steven L.; Iyer, Subramanian S.; Fleetwood, Daniel M.

Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors

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Institute of Electrical and Electronics Engineers (IEEE), 2023

Published in: IEEE Transactions on Electron Devices
Jia, Hao; McCandless, Jonathan P.; Chen, Hailong; Liao, Wenjun; Zhang, En Xia; McCurdy, Michael; Reed, Robert A.; Schrimpf, Ronald D.; Alles, Michael L.; Feng, Philip X.-L.

Proton radiation effects on optically transduced silicon carbide microdisk resonators

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Optica Publishing Group, 2023

Published in: Optical Materials Express
Brewer, Rachel M.; Zhang, En Xia; Gorchichko, Mariia; Wang, Peng Fei; Cox, Jonathan; Moran, Steven L.; Ball, Dennis R.; Sierawski, Brian D.; Fleetwood, Daniel M.; Schrimpf, Ronald D.; Iyer, Subramanian S.; Alles, Michael L.

Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors

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Institute of Electrical and Electronics Engineers (IEEE), 2021

Published in: IEEE Transactions on Nuclear Science
Brewer, Rachel M.; Reed, Robert A.; Moran, Steven L.; Cox, Jonathan; Sierawski, Brian D.; McCurdy, Michael W.; Zhang, En Xia; Iyer, Subramanian S.; Schrimpf, Ronald D.; Alles, Michael L.

The Impact of Proton-Induced Single Events on Image Classification in a Neuromorphic Computing Architecture

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Institute of Electrical and Electronics Engineers (IEEE), 2020

Published in: IEEE Transactions on Nuclear Science
Montes, Enrique J.; Reed, Robert A.; Pellish, Jonathan A.; Alles, Michael L.; Schrimpf, Ronald D.; Weller, Robert A.; Varadharajaperumal, Muthubalan; Niu, Guofu; Sutton, Akil K.; Diestelhorst, Ryan; Espinel, Gustavo; Krithivasan, Ramkumar; Comeau, Jonathan P.; Cressler, John D.; Marshall, Paul W.; Vizkelethy, Gyorgy

Single Event Upset Mechanisms for Low-Energy-Deposition Events in SiGe HBTs

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Institute of Electrical and Electronics Engineers (IEEE), 2008

Published in: IEEE Transactions on Nuclear Science
Pellish, Jonathan A.; Reed, Robert A.; Schrimpf, Ronald D.; Alles, Michael L.; Varadharajaperumal, Muthubalan; Niu, Guofu; Sutton, Akil K.; Diestelhorst, Ryan M.; Espinel, Gustavo; Krithivasan, Ramkumar; Comeau, Jonathan P.; Cressler, John D.; Vizkelethy, Gyorgy; Marshall, Paul W.; Weller, Robert A.; Mendenhall, Marcus H.; Montes, Enrique J.

Substrate Engineering Concepts to Mitigate Charge Collection in Deep Trench Isolation Technologies

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Institute of Electrical and Electronics Engineers (IEEE), 2006

Published in: IEEE Transactions on Nuclear Science
Sierawski, Brian D.; Warren, Kevin M.; Sternberg, Andrew L.; Austin, Rebekah A.; Trippe, James M.; McCurdy, Michael W.; Reed, Robert A.; Weller, Robert A.; Alles, Michael L.; Schrimpf, Ronald D.; Massengill, Lloyd W.; Fleetwood, Daniel M.; Monteiro, Anthony; Buxton, Gerald W.; Brandenburg, Jonathan C.; Fisher, W. Burns; Davis, Robert

CubeSats and Crowd-Sourced Monitoring for Single Event Effects Hardness Assurance

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Institute of Electrical and Electronics Engineers (IEEE), 2017

Published in: IEEE Transactions on Nuclear Science

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