Skip to contents Hytch, Martin [Editor]; Hawkes, Peter W. [Editor] Advances in Imaging and Electron Physics Books View online Schließen > Access ... to E-book Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Amsterdam: Academic Press, 2020 Published in: Issn Ser Nicolai, Lars [Author] ; Engel-Herbert, Roman [Other]; Capellini, Giovanni [Other]; Hÿtch, Martin [Other] Interface Tomography of III-V Semiconductor Heterostructures Books View online Schließen > Access ... to E-book via DOI ... to E-book via Resolving system ... to E-book via German National Library Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Berlin: Humboldt-Universität zu Berlin, 2023 Nicolai, Lars [Author] ; Engel-Herbert, Roman [Other]; Capellini, Giovanni [Other]; Hÿtch, Martin [Other] Interface Tomography of III-V Semiconductor Heterostructures Books View online Schließen > Access ... to E-book via DOI (freely accessible) ... to E-book via Resolving system (freely accessible) Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Berlin: Humboldt-Universität zu Berlin, 2023 Hytch, Martin J. Analysis of Variations in Structure from High Resolution Electron Microscope Images by Combining Real Space and Fourier Space Information Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. EDP Sciences, 1997 Published in: Microscopy Microanalysis Microstructures, 8 (1997) 1, Seite 41-57 Gatel, Christophe; Dupuy, Julien; Hÿtch, Martin Dynamic automation in transmission electron microscopy: application to electron holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Oxford University Press (OUP), 2021 Published in: Microscopy and Microanalysis, 27 (2021) S1, Seite 248-250 Cherkashin, Nikolay; Denneulin, Thibaud; Hÿtch, Martin J. Electron microscopy by specimen design: application to strain measurements Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2017 Published in: Scientific Reports, 7 (2017) 1 Hÿtch, Martin J.; Minor, Andrew M. Observing and measuring strain in nanostructures and devices with transmission electron microscopy Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2014 Published in: MRS Bulletin, 39 (2014) 2, Seite 138-146 Cherkashin, Nikolay; Kononchuk, Oleg; Hÿtch, Martin Reconstruction of a High Angle Tilt (110)/(001) Boundary in Si Using O-lattice Theory Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Trans Tech Publications, Ltd., 2011 Published in: Solid State Phenomena, 178-179 (2011), Seite 489-494 Thibault-Pénisson, Jany; Hÿtch, Martin J. HREM Study of the Strain Field Induced by the Entrance of a Matrix Dislocation within the Coherent Twin GB in Ge Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Trans Tech Publications, Ltd., 2007 Published in: Solid State Phenomena, 131-133 (2007), Seite 437-442 Thibault-Pénisson, Jany; Hÿtch, Martin J. Solid State Phenomena: HREM Study of the Strain Field Induced by the Entrance of a Matrix Dislocation within the Coherent Twin GB in Ge Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Trans Tech Publications Ltd., 2007 Published in: Solid State Phenomena (2007), Seite 437-442 Boureau, Victor; Reboh, Shay; Benoit, Daniel; Hÿtch, Martin; Claverie, Alain Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. AIP Publishing, 2019 Published in: APL Materials, 7 (2019) 4 Denneulin, Thibaud; Maeng, Wanjoo; Eom, Chang-Beom; Hÿtch, Martin Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. AIP Publishing, 2017 Published in: Journal of Applied Physics, 121 (2017) 5 Cherkashin, Nikolay; Reboh, Shay; Lubk; Hÿtch, Martin J.; Claverie, Alain Strain in Hydrogen-Implanted Si Investigated Using Dark-Field Electron Holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. IOP Publishing, 2013 Published in: Applied Physics Express, 6 (2013) 9, Seite 091301 Hytch, Martin; Cherkashin, Nikolay; Reboh, Shay; Houdellier, Florent; Claverie, Alain Strain mapping in layers and devices by electron holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2011 Published in: physica status solidi (a), 208 (2011) 3, Seite 580-583 Hüe, Florian; Hÿtch, Martin; Houdellier, Florent; Bender, Hugo; Claverie, Alain Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. AIP Publishing, 2009 Published in: Applied Physics Letters, 95 (2009) 7 Hüe, Florian; Hÿtch, Martin; Bender, Hugo; Houdellier, Florent; Claverie, Alain Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. American Physical Society (APS), 2008 Published in: Physical Review Letters, 100 (2008) 15 Sennour, Mohamed; Lartigue-Korinek, Sylvie; Champion, Yannick; Hÿtch, Martin J. Local strain analysis in twin boundaries in ultrafine grained copper Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2008 Published in: Journal of Materials Science, 43 (2008) 11, Seite 3806-3811 Hÿtch, Martin; Houdellier, Florent; Hüe, Florian; Snoeck, Etienne Nanoscale holographic interferometry for strain measurements in electronic devices Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2008 Published in: Nature, 453 (2008) 7198, Seite 1086-1089 Hüe, Florian; Hytch, Martin; Houdellier, Florent; Snoeck, Etienne; Claverie, Alain Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Elsevier BV, 2008 Published in: Materials Science and Engineering: B, 154-155 (2008), Seite 221-224 Hÿtch, Martin J.; Putaux, Jean-Luc; Pénisson, Jean-Michel Materials Science Forum: Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Trans Tech Publications Ltd., 2005 Published in: Materials Science Forum (2005), Seite 39-44
Hytch, Martin [Editor]; Hawkes, Peter W. [Editor] Advances in Imaging and Electron Physics Books View online Schließen > Access ... to E-book Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Amsterdam: Academic Press, 2020 Published in: Issn Ser
Nicolai, Lars [Author] ; Engel-Herbert, Roman [Other]; Capellini, Giovanni [Other]; Hÿtch, Martin [Other] Interface Tomography of III-V Semiconductor Heterostructures Books View online Schließen > Access ... to E-book via DOI ... to E-book via Resolving system ... to E-book via German National Library Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Berlin: Humboldt-Universität zu Berlin, 2023
> Access ... to E-book via DOI ... to E-book via Resolving system ... to E-book via German National Library
Nicolai, Lars [Author] ; Engel-Herbert, Roman [Other]; Capellini, Giovanni [Other]; Hÿtch, Martin [Other] Interface Tomography of III-V Semiconductor Heterostructures Books View online Schließen > Access ... to E-book via DOI (freely accessible) ... to E-book via Resolving system (freely accessible) Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Berlin: Humboldt-Universität zu Berlin, 2023
> Access ... to E-book via DOI (freely accessible) ... to E-book via Resolving system (freely accessible)
Hytch, Martin J. Analysis of Variations in Structure from High Resolution Electron Microscope Images by Combining Real Space and Fourier Space Information Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. EDP Sciences, 1997 Published in: Microscopy Microanalysis Microstructures, 8 (1997) 1, Seite 41-57
Gatel, Christophe; Dupuy, Julien; Hÿtch, Martin Dynamic automation in transmission electron microscopy: application to electron holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Oxford University Press (OUP), 2021 Published in: Microscopy and Microanalysis, 27 (2021) S1, Seite 248-250
Cherkashin, Nikolay; Denneulin, Thibaud; Hÿtch, Martin J. Electron microscopy by specimen design: application to strain measurements Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2017 Published in: Scientific Reports, 7 (2017) 1
Hÿtch, Martin J.; Minor, Andrew M. Observing and measuring strain in nanostructures and devices with transmission electron microscopy Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2014 Published in: MRS Bulletin, 39 (2014) 2, Seite 138-146
Cherkashin, Nikolay; Kononchuk, Oleg; Hÿtch, Martin Reconstruction of a High Angle Tilt (110)/(001) Boundary in Si Using O-lattice Theory Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Trans Tech Publications, Ltd., 2011 Published in: Solid State Phenomena, 178-179 (2011), Seite 489-494
Thibault-Pénisson, Jany; Hÿtch, Martin J. HREM Study of the Strain Field Induced by the Entrance of a Matrix Dislocation within the Coherent Twin GB in Ge Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Trans Tech Publications, Ltd., 2007 Published in: Solid State Phenomena, 131-133 (2007), Seite 437-442
Thibault-Pénisson, Jany; Hÿtch, Martin J. Solid State Phenomena: HREM Study of the Strain Field Induced by the Entrance of a Matrix Dislocation within the Coherent Twin GB in Ge Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Trans Tech Publications Ltd., 2007 Published in: Solid State Phenomena (2007), Seite 437-442
Boureau, Victor; Reboh, Shay; Benoit, Daniel; Hÿtch, Martin; Claverie, Alain Strain evolution of SiGe-on-insulator obtained by the Ge-condensation technique Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. AIP Publishing, 2019 Published in: APL Materials, 7 (2019) 4
Denneulin, Thibaud; Maeng, Wanjoo; Eom, Chang-Beom; Hÿtch, Martin Lattice reorientation in tetragonal PMN-PT thin film induced by focused ion beam preparation for transmission electron microscopy Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. AIP Publishing, 2017 Published in: Journal of Applied Physics, 121 (2017) 5
Cherkashin, Nikolay; Reboh, Shay; Lubk; Hÿtch, Martin J.; Claverie, Alain Strain in Hydrogen-Implanted Si Investigated Using Dark-Field Electron Holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. IOP Publishing, 2013 Published in: Applied Physics Express, 6 (2013) 9, Seite 091301
Hytch, Martin; Cherkashin, Nikolay; Reboh, Shay; Houdellier, Florent; Claverie, Alain Strain mapping in layers and devices by electron holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2011 Published in: physica status solidi (a), 208 (2011) 3, Seite 580-583
Hüe, Florian; Hÿtch, Martin; Houdellier, Florent; Bender, Hugo; Claverie, Alain Strain mapping of tensiley strained silicon transistors with embedded Si1−yCy source and drain by dark-field holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. AIP Publishing, 2009 Published in: Applied Physics Letters, 95 (2009) 7
Hüe, Florian; Hÿtch, Martin; Bender, Hugo; Houdellier, Florent; Claverie, Alain Direct Mapping of Strain in a Strained Silicon Transistor by High-Resolution Electron Microscopy Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. American Physical Society (APS), 2008 Published in: Physical Review Letters, 100 (2008) 15
Sennour, Mohamed; Lartigue-Korinek, Sylvie; Champion, Yannick; Hÿtch, Martin J. Local strain analysis in twin boundaries in ultrafine grained copper Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2008 Published in: Journal of Materials Science, 43 (2008) 11, Seite 3806-3811
Hÿtch, Martin; Houdellier, Florent; Hüe, Florian; Snoeck, Etienne Nanoscale holographic interferometry for strain measurements in electronic devices Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Springer Science and Business Media LLC, 2008 Published in: Nature, 453 (2008) 7198, Seite 1086-1089
Hüe, Florian; Hytch, Martin; Houdellier, Florent; Snoeck, Etienne; Claverie, Alain Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Elsevier BV, 2008 Published in: Materials Science and Engineering: B, 154-155 (2008), Seite 221-224
Hÿtch, Martin J.; Putaux, Jean-Luc; Pénisson, Jean-Michel Materials Science Forum: Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Trans Tech Publications Ltd., 2005 Published in: Materials Science Forum (2005), Seite 39-44
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