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  1. Borrione, Dominique [Editor] ; DATE 1999 München, European Design Automation Association, Electronic Design Automation Consortium, IEEE Computer Society Test Technology Technical Committee, Association for Computing Machinery Special Interest Group on Design Automation

    Design, Automation and Test in Europe Conference and Exhibition 1999 : proceedings, Munich, Germany, March 9 - 12, 1999

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 1999

  2. Renovell, Michel [Other] ; IEEE Computer Society Test Technology Technical Council

    12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2009 : DDECS '09 ; Liberec, Czech Republic, 15 - 17 April 2009

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    Piscataway, NJ: IEEE, 2009

  3. Osseiran, Adam [Other] ; IEEE Computer Society Test Technology Technical Council

    4th IEEE International Symposium on Electronic Design, Test and Applications, 2008 : Delta 2008 ; 23 - 25 Jan. 2008, Hong Kong, SAR, China

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2008

  4. Abadir, Magdy S. [Other] ; IEEE Computer Society Test Technology Technical Council

    Seventh International Workshop on Microprocessor Test and Verification, 2006 : MTV '06 ; Austin, Texas, 4 - 5 Dec. 2006

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    Los Alamitos, Calif. [u.a.]: IEEE Computer Society, 2007