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  1. Muller, Richard S. [Editor] ; IEEE Electron Devices Society

    Microsensors

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    New York, NY: IEEE Pr., 1991

    Published in: IEEE Press selected reprint series

  2. Mondt, Jack F. [Editor] ; Thermionic Conversion Specialist Conference 10 1971 San Diego, Calif, Institute of Electrical and Electronics Engineers Electron Devices Group

    IEEE conference record of 1971 Thermionic Conversion Specialist Conference : papers presented at the Tenth Annual Conference, San Diego, California, October 4 - 6, 1971

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    New York, NY: Institute of Electrical and Electronics Engineers, 1971

  3. VanHoomissen, J. E. [Editor] ; Thermionic Conversion Specialist Conference 7 1968 Framingham, Mass, Institute of Electrical and Electronics Engineers Electron Devices Group

    IEEE conference record of 1968 Thermionic Conversion Specialist Conference : papers presented at the Seventh Annual Conference, Framingham, Massachusetts, October 21 - 23, 1968

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    New York, NY: Institute of Electrical and Electronics Engineers, 1968

  4. IEEE Electron Devices Society, International Reliability Physics Symposium

    Reliability physics : annual proceedings

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    New York, NY: IEEE, 1974-1989 / 12.1974 - 27.1989

  5. Symposium on VLSI Technology, IEEE Electron Devices Society, Ōyō-Butsuri-Gakkai

    Digest of technical papers

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    Tokyo: Japan Soc. of Applied Physics, 1981-1989 / [1].1981 - 9.1989

  6. Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society, International Reliability Physics Symposium 33 1995 Las Vegas, Nev

    1995 IEEE international reliability physics proceedings : 33rd annual

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    Piscataway, NJ: IEEE Service Center, 1995