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Piscataway, N.J: IEEE, 1998
Mui, Yew Cheong
[Other]
;
Electronics Packaging Technology Conference 7 2005 Singapur,
IEEEReliability/CPMT/EDSingaporeChapter,
Components, Packaging, and Manufacturing Technology Society,
International Microelectronics and Packaging Society
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Piscataway, NJ: IEEE Service Center, 2004
Ho, Philip
[Other]
;
International Symposium on the Physical & Failure Analysis of Integrated Circuits (10th :2003 :Singapore),
IEEEReliability/CPMT/EDSingaporeChapter,
IEEE Electron Devices Society,
IEEE Reliability Society,
National University of Singapore Centre for IC Failure Analysis and Reliability
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Piscataway, NJ: IEEE, 2000
Chung, Steve S.
[Other]
;
International Symposium on the Physical & Failure Analysis of Integrated Circuits (11th :2004 :Taipei, Taiwan),
IEEE Electron Devices Society Taipei Chapter,
IEEE Electron Devices Society,
IEEEReliability/CPMT/EDSingaporeChapter