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Raveendran, Vivek [Author] ; Liserre, Marco [Degree supervisor]; Faulwasser, Timm [Other]; Khatir, Zoubir [Other]

Control Strategies for Improving Reliability and Efficiency in Modular Power Converters

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Kiel: Universitätsbibliothek Kiel, 2022
Khatir, Zoubir

Junction Temperature Investigations Based on a General Semi-analytical Formulation of Forward Voltage of Power Diodes

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Institute of Electrical and Electronics Engineers (IEEE), 2012

Published in: IEEE Transactions on Electron Devices
Hamieh, Tayssir; Ibrahim, Ali; Khatir, Zoubir

Thermal Fatigue Effect on the Grain Groove Profile in the Case of Diffusion in Thin Polycrystalline Films of Power Electronic Devices

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MDPI AG, 2023

Published in: Micromachines
Hamieh, Tayssir; Khatir, Zoubir; Ibrahim, Ali

Analytical Solutions to the Problem of the Grain Groove Profile

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Symbiosis Group, 2018

Published in: Nanoscience & Technology: Open Access
Hamieh, Tayssir; Khatir, Zoubir; Ibrahim, Ali

New solution of the partial differential equation of the grain groove profile problem in the case of evaporation/condensation

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Springer Science and Business Media LLC, 2019

Published in: Scientific Reports
Tran, Son Ha; Dupont, Laurent; Khatir, Zoubir

Electrothermal Evaluation of Single and Multiple Solder Void Effects on Low-Voltage Si MOSFET Behavior in Forward Bias Conditions

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Institute of Electrical and Electronics Engineers (IEEE), 2017

Published in: IEEE Transactions on Components, Packaging and Manufacturing Technology
Moussodji, Jeff; Kociniewski, Thierry; Khatir, Zoubir

Dynamic IGBT model. Application to top-metal ageing effects on chip electro-thermal distributions during short circuit operations

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International Information and Engineering Technology Association, 2014

Published in: European Journal of Electrical Engineering
Avenas, Yvan; Dupont, Laurent; Khatir, Zoubir

Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters—A Review

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Institute of Electrical and Electronics Engineers (IEEE), 2012

Published in: IEEE Transactions on Power Electronics
Ibrahim, Ali; Khatir, Zoubir; Dupont, Laurent

Characterization and Aging Test Methodology for Power Electronic Devices at High Temperature

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Trans Tech Publications, Ltd., 2011

Published in: Advanced Materials Research
Khatir, Zoubir; Lallemand, Richard; Ibrahim, Ali; Ingrosso, Damien

Thermal Stress Analysis Comparison in IGBT Power Modules between DC and Switching Power Cycling

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Institute of Electrical and Electronics Engineers (IEEE), 2023

Published in: IEEE Transactions on Power Electronics
Halouani, Ayda; Khatir, Zoubir; Shqair, Mustafa; Ibrahim, Ali; Pichon, Pierre-Yves

An EBSD Study of Fatigue Crack Propagation in Bonded Aluminum Wires Cycled from 55°C to 85°C

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Springer Science and Business Media LLC, 2022

Published in: Journal of Electronic Materials
Schuler, Louis; Chamoin, Ludovic; Khatir, Zoubir; Berkani, Mounira; Ouhab, Merouane; Degrenne, Nicolas

Iterative PGD model reduction for the strongly-coupled thermomechanical analysis of crack propagation in power electronic modules

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Springer Science and Business Media LLC, 2022

Published in: Computational Mechanics
Schuler, Louis; Chamoin, Ludovic; Khatir, Zoubir; Berkani, Mounira; Ouhab, Merouane; Degrenne, Nicolas

A Reduced Model Based on Proper Generalized Decomposition for the Fast Analysis of IGBT Power Modules Lifetime

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ASME International, 2022

Published in: Journal of Electronic Packaging
Khatir, Zoubir; Tran, Son-Ha; Ibrahim, Ali; Lallemand, Richard; Degrenne, Nicolas

Effect of load sequence interaction on bond-wire lifetime due to power cycling

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Springer Science and Business Media LLC, 2021

Published in: Scientific Reports
Ouhab, Merouane; Khatir, Zoubir; Ibrahim, Ali; Ousten, Jean-Pierre; Mitova, Radoslava; Wang, Miao-Xin

New Analytical Model for Real-Time Junction Temperature Estimation of Multichip Power Module Used in a Motor Drive

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Institute of Electrical and Electronics Engineers (IEEE), 2018

Published in: IEEE Transactions on Power Electronics
Thollin, Benoit; Dupont, Laurent; Avenas, Yvan; Crebier, Jean-Christophe; Khatir, Zoubir; Jeannin, Pierre-Olivier

Numerical and Experimental Evaluation of the Microsecond Pulsed Heating Curve Technique Dedicated to Die Interconnection Characterization

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Institute of Electrical and Electronics Engineers (IEEE), 2016

Published in: IEEE Transactions on Components, Packaging and Manufacturing Technology
Itani, Khaled; De Bernardinis, Alexandre; Khatir, Zoubir; Jammal, Ahmad; Oueidat, Mohamad

Regenerative Braking Modeling, Control, and Simulation of a Hybrid Energy Storage System for an Electric Vehicle in Extreme Conditions

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Institute of Electrical and Electronics Engineers (IEEE), 2016

Published in: IEEE Transactions on Transportation Electrification
Smet, Vanessa; Forest, Francois; Huselstein, Jean-Jacques; Richardeau, Frédéric; Khatir, Zoubir; Lefebvre, Stéphane; Berkani, Mounira

Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling

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Institute of Electrical and Electronics Engineers (IEEE), 2011

Published in: IEEE Transactions on Industrial Electronics
Berkani, Mounira; Lefebvre, Stéphane; Boughrara, Narjes; Khatir, Zoubir; Faugières, Jean-Claude; Friedrichs, Peter; Haddouche, Ali

Estimation of SiC JFET temperature during short-circuit operations

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Elsevier BV, 2009

Published in: Microelectronics Reliability
Tran, Son-Ha; Khatir, Zoubir; Lallemand, Richard; Ibrahim, Ali; Ousten, Jean-Pierre; Ewanchuk, Jeffrey; Mollov, Stefan V.

Constant ΔTj Power Cycling Strategy in DC Mode for Top-Metal and Bond-Wire Contacts Degradation Investigations

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Institute of Electrical and Electronics Engineers (IEEE), 2019

Published in: IEEE Transactions on Power Electronics

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