Skip to contents Knaub, Nikolai [Author] ; Volz, Kerstin [Degree supervisor] Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy Books View online Schließen > Access ... to E-book via DOI ... to E-book via Resolving system ... to E-book via German National Library Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Marburg: Philipps-Universität Marburg, 2016 Beyer, Andreas; Knaub, Nikolai; Volz, Kerstin Quantitative Determination of Chemical Composition of Multinary III/V Semiconductors With Sublattice Resolution Using Aberration Corrected HAADF-STEM Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Oxford University Press (OUP), 2015 Published in: Microscopy and Microanalysis, 21 (2015) S3, Seite 2081-2082 Butkutė, Renata; Pačebutas, Vaidas; Krotkus, Arūnas; Knaub, Nikolai; Volz, Kerstin Migration-enhanced epitaxy of thin GaAsBi layers Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Lithuanian Academy of Sciences, 2014 Published in: Lithuanian Journal of Physics, 54 (2014) 2, Seite 125-129 Butkutė, Renata; Pačebutas, Vaidas; Krotkus, Arūnas; Knaub, Nikolai; Volz, Kerstin Migration-enhanced epitaxy of thin GaAsBi layers Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Lithuanian Academy of Sciences, 2014 Published in: Lithuanian Journal of Physics, 54 (2014) 2, Seite 125-129 Grieb, Tim; Müller, Knut; Fritz, Rafael; Schowalter, Marco; Neugebohrn, Nils; Knaub, Nikolai; Volz, Kerstin; Rosenauer, Andreas Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Elsevier BV, 2012 Published in: Ultramicroscopy, 117 (2012), Seite 15-23 van der Wilt, Paul C.; Lee, Hyeongjae; Huang, Shiwen; Knaub, Nikolai; Hu, Qiongying; Zhao, Lai; Mueller, Bernhard P‐148: Inspection of Excimer‐Laser Annealed Thin Silicon Films Across the Length Scale of Interest Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2023 Published in: SID Symposium Digest of Technical Papers, 54 (2023) 1, Seite 1470-1473 Meng, Lin; Li, Lingjia; Knaub, Nikolai; Li, Xiao; Li, Ji; Trauner, Robert; Schueler, Bernhard; Huang, Shiwen; Mueller, Bernhard; Daiker, Volker 48.1: Inline Low Temperature Polycrystalline Silicon Roughness and Grain Size Metrology Enabled by Electron Beam Review for a Better Process Control of Excimer Laser Annealing Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2022 Published in: SID Symposium Digest of Technical Papers, 53 (2022) S1, Seite 478-481 Peng, Pai; Meng, Lin; Li, Lingjia; Geng, Tao; Mei, Xiaohan; Knaub, Nikolai; Shen, Lei; Li, Xiao; Wu, Chengye 41.3: A New Inspection and Review Solution with EFIB Accelerating the Yield Ramp of Display Panel Manufacturing Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2021 Published in: SID Symposium Digest of Technical Papers, 52 (2021) S2, Seite 505-508 Cojocaru-Mirédin, Oana; Fu, Yanpeng; Kostka, Aleksander; Sáez-Araoz, Rodrigo; Beyer, Andreas; Knaub, Nikolai; Volz, Kerstin; Fischer, Christian-Herbert; Raabe, Dierk Interface engineering and characterization at the atomic-scale of pure and mixed ion layer gas reaction buffer layers in chalcopyrite thin-film solar cells : Engineering and characterization of pure and mixed ILGAR buffer layers : Engineering and characterization of pure and mixed ILGAR buffer layers Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2015 Published in: Progress in Photovoltaics: Research and Applications, 23 (2015) 6, Seite 705-716
Knaub, Nikolai [Author] ; Volz, Kerstin [Degree supervisor] Structural analysis of dilute bismide alloys by means of high resolution scanning transmission electron microscopy Books View online Schließen > Access ... to E-book via DOI ... to E-book via Resolving system ... to E-book via German National Library Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Marburg: Philipps-Universität Marburg, 2016
> Access ... to E-book via DOI ... to E-book via Resolving system ... to E-book via German National Library
Beyer, Andreas; Knaub, Nikolai; Volz, Kerstin Quantitative Determination of Chemical Composition of Multinary III/V Semiconductors With Sublattice Resolution Using Aberration Corrected HAADF-STEM Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Oxford University Press (OUP), 2015 Published in: Microscopy and Microanalysis, 21 (2015) S3, Seite 2081-2082
Butkutė, Renata; Pačebutas, Vaidas; Krotkus, Arūnas; Knaub, Nikolai; Volz, Kerstin Migration-enhanced epitaxy of thin GaAsBi layers Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Lithuanian Academy of Sciences, 2014 Published in: Lithuanian Journal of Physics, 54 (2014) 2, Seite 125-129
Butkutė, Renata; Pačebutas, Vaidas; Krotkus, Arūnas; Knaub, Nikolai; Volz, Kerstin Migration-enhanced epitaxy of thin GaAsBi layers Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Lithuanian Academy of Sciences, 2014 Published in: Lithuanian Journal of Physics, 54 (2014) 2, Seite 125-129
Grieb, Tim; Müller, Knut; Fritz, Rafael; Schowalter, Marco; Neugebohrn, Nils; Knaub, Nikolai; Volz, Kerstin; Rosenauer, Andreas Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Elsevier BV, 2012 Published in: Ultramicroscopy, 117 (2012), Seite 15-23
van der Wilt, Paul C.; Lee, Hyeongjae; Huang, Shiwen; Knaub, Nikolai; Hu, Qiongying; Zhao, Lai; Mueller, Bernhard P‐148: Inspection of Excimer‐Laser Annealed Thin Silicon Films Across the Length Scale of Interest Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2023 Published in: SID Symposium Digest of Technical Papers, 54 (2023) 1, Seite 1470-1473
Meng, Lin; Li, Lingjia; Knaub, Nikolai; Li, Xiao; Li, Ji; Trauner, Robert; Schueler, Bernhard; Huang, Shiwen; Mueller, Bernhard; Daiker, Volker 48.1: Inline Low Temperature Polycrystalline Silicon Roughness and Grain Size Metrology Enabled by Electron Beam Review for a Better Process Control of Excimer Laser Annealing Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2022 Published in: SID Symposium Digest of Technical Papers, 53 (2022) S1, Seite 478-481
Peng, Pai; Meng, Lin; Li, Lingjia; Geng, Tao; Mei, Xiaohan; Knaub, Nikolai; Shen, Lei; Li, Xiao; Wu, Chengye 41.3: A New Inspection and Review Solution with EFIB Accelerating the Yield Ramp of Display Panel Manufacturing Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2021 Published in: SID Symposium Digest of Technical Papers, 52 (2021) S2, Seite 505-508
Cojocaru-Mirédin, Oana; Fu, Yanpeng; Kostka, Aleksander; Sáez-Araoz, Rodrigo; Beyer, Andreas; Knaub, Nikolai; Volz, Kerstin; Fischer, Christian-Herbert; Raabe, Dierk Interface engineering and characterization at the atomic-scale of pure and mixed ion layer gas reaction buffer layers in chalcopyrite thin-film solar cells : Engineering and characterization of pure and mixed ILGAR buffer layers : Engineering and characterization of pure and mixed ILGAR buffer layers Articles View online Schließen > Access Close > Bookmarks You can manage bookmarks using lists, please log in to your user account for this. Wiley, 2015 Published in: Progress in Photovoltaics: Research and Applications, 23 (2015) 6, Seite 705-716
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