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Boston; London: Artech House, 2000
Published in:Artech House signal processing library
Rajsuman, Rochit
[Other]
;
IEEE International Workshop on Memory Technology, Design, and Testing (1994 :San Jose, Calif.),
IEEE Computer Society Test Technology Technical Committee,
IEEE Computer Society Technical Committee on VLSI
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Los Alamitos, Calif: IEEE Computer Society Press, 1993
Rajsuman, Rochit
[Other];
Wik, Thomas
[Other]
;
IEEE International Workshop on Memory Technology, Design, and Testing (12th :2004 :San Jose, Calif.),
IEEE Computer Society,
IEEE Computer Society Technical Committee on VLSI,
IEEE Computer Society Technical Council on Test Technology,
IEEE Solid-State Circuits Society
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Los Alamitos, Calif: IEEE Computer Society, 2004
Rajsuman, Rochit
[Other];
Wik, Thomas
[Other]
;
IEEE International Workshop on Memory Technology, Design, and Testing (1999 :San Jose, Calif.),
IEEE Computer Society,
IEEE Computer Society Technical Committee on VLSI,
IEEE Computer Society Technical Council on Test Technology,
IEEE Solid-State Circuits Council
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[Piscataway, N.J.]: IEEE, 2001
Rajsuman, Rochit
[Other];
Wik, Thomas
[Other]
;
IEEE International Workshop on Memory Technology, Design, and Testing (8th :2000 :San Jose, Calif.),
IEEE Computer Society,
IEEE Computer Society Technical Committee on VLSI,
IEEE Computer Society Technical Council on Test Technology,
IEEE Solid-State Circuits Society
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Los Alamitos, Calif: IEEE Computer Society, 2000
Rajkanan, Kamal
[Other];
Rajsuman, Rochit
[Other]
;
IEEE International Workshop on Memory Technology, Design, and Testing (1995 :San Jose, Calif.),
IEEE Computer Society Test Technology Technical Committee,
IEEE Computer Society Technical Committee on VLSI,
IEEE Solid-State Circuits Council
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Los Alamitos, Calif: IEEE Computer Society Press, 1995
Singh, Adit
[Other];
Rajsuman, Rochit
[Other];
Wit, Tom
[Other]
;
IEEE International Workshop on Memory Technology, Design, and Testing (11th :2003 :San Jose, Calif.),
IEEE Computer Society,
IEEE Computer Society Technical Committee on VLSI,
IEEE Computer Society Technical Council on Test Technology,
IEEE Solid-State Circuits Society
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Los Alamitos, Calif: IEEE Computer Society, 2003
Lombardi, Fabrizio
[Other];
Rajsuman, Rochit
[Other];
Wik, Thomas
[Other]
;
IEEE International Workshop on Memory Technology, Design, and Testing (1997 :San Jose, Calif.),
IEEE Computer Society Technical Committee on VLSI,
IEEE Computer Society Test Technology Technical Committee,
IEEE Solid-State Circuits Council